报价前别空手Before Quoting

项目资料与验收清单Project inputs & acceptance checks

这里放通用检查表。不是为了把沟通变复杂,而是为了少一点“这个我没说吗”的尴尬时刻。以后有可公开样品图,也会慢慢补进来。Reusable checks live here. The goal is not more paperwork; it is fewer missing-detail moments.

01 报价前检查01 Before Quotation

报价与工艺评估所需资料Inputs for quotation and process assessment

目标结构说明要做什么结构,用于什么测试或验证。Target structure and intended validation.
版图文件GDS/DXF/PDF、截图、top cell、layer 说明。GDS/DXF/PDF, screenshots, top cell and layers.
关键尺寸最小线宽、线距、周期、孔径、面积和深宽比。CD, spacing, period, holes, area and aspect ratio.
材料堆栈基底、膜层、厚度、片径、数量和前道状态。Substrate, films, thickness, wafer size, quantity and prior state.
工艺目标刻蚀深度、膜厚、套刻、lift-off、键合或检测目标。Etch depth, film thickness, overlay, lift-off, bonding or metrology targets.
验收标准用 SEM、显微、轮廓、电学或光学数据验收。Acceptance by SEM, optical, profile, electrical or optical data.
风险限制温度、化学品、污染、应力、崩边、残胶和样品脆弱性。Temperature, chemicals, contamination, stress, chipping, residue and fragility.
交付要求样品数量、照片、测试记录、交付时间和复盘建议。Quantity, images, test records, timeline and review notes.

02 案例记录模板02 Case Record Template

可复核的样品与案例记录Traceable sample and case records

01

输入条件Inputs

材料、片源、版图、目标尺寸、前道状态和不能承受的工艺限制。Materials, samples, layout, target dimensions, prior state and process limits.

02

工艺路径Process Route

写清采用了哪些工艺环节、顺序、关键参数和中间检查点。List steps, sequence, key parameters and intermediate checks.

03

输出结果Output

样品、显微/SEM 图、尺寸记录、测试数据、问题复盘和下一轮建议。Samples, SEM/optical images, dimensions, test data, issues and next suggestions.

03 常见问题03 Common Issues

加工前需要确认的风险Risks to clarify before fabrication

Etch / Film

刻蚀和膜层风险Etch and Film Risk

侧壁形貌、选择比、膜层应力、附着力、残胶和污染需要提前说明。Sidewall profile, selectivity, film stress, adhesion, residue and contamination matter.

Sample Handling

样品处理风险Sample Handling

小片、薄片、脆性材料、已加工样品、贵重样品要提前说明保护方式。Small, thin, fragile, pre-processed or valuable samples need handling notes.

项目沟通邮件模板Project inquiry template

查看完整资料清单View full checklist

需要指导Need Guidance

资料不完整也能先聊,别让项目卡在开头。Incomplete inputs can still start the conversation.

我可以先把现有条件整理成别人能判断的说法,再看要不要补版图、补检测方式,或者把工艺目标重新说一遍。I can organize what exists first, then decide whether layout, metrology or the process goal needs more work.

继续查看Continue

继续查看工艺路线参考Explore process route references